The Global Techniques Sharing Platform For Materials Testing

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Driving Innovation Through Precise

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OUR TECHNIQUES

The Techniques That Drive Our Quality

Our commitment to quality stems from proven techniques and meticulous attention to detail. Each process is carefully crafted to ensure excellence, reliability, and satisfaction in every outcome.

SEM

Scanning Electron Microscopy (SEM) provides high-resolution and high-depth-of-field images of the sample surface and near-surface

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FIB

A Focused Ion Beam (FIB) instrument uses a finely focused ion beam to modify and image the sample of interest.

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AFM

Atomic Force Microscopy (AFM) analysis provides images with near-atomic resolution for measuring surface topography.

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FTIR

FTIR (Fourier Transform Infrared Spectroscopy) is a technique used to obtain an infrared spectrum of absorption or emission of a solid, liquid, or gas.

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OUR FEATURED PRODUCTS

Iqiege 50S precision cutter

The machine is composed of fuselage, control panel, protective cover of cutting room, motor, transverse feed mechanism, loading lever mechanism, cooling system, diamond cutting piece and other components.

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Tungsten Filament SEM | SEM3200

High-performance tungsten filament SEM microscope with excellent imaging quality capabilities in both high and low vacuum modes The CIQTEK SEM3200 SEM Microscope has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.

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Ultra-high Resolution FESEM | SEM5000X

Ultra-high resolution Field Emission Scanning Electron Microscopy (FESEM): 0.6 nm@15 kV and 1.0 nm@1 kV The CIQTEK SEM5000X ultra-high resolution FESEM utilizes the upgraded column engineering process, “SuperTunnel” technology, and high-resolution objective lens design to improve low-voltage imaging resolution. The FESEM SEM5000X specimen chamber ports extend to 16, and the specimen exchange load-lock supports up to 8-inch […]

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CX40M Metallurgical Microscope

As an upgraded metallurgical microscope, CX40M re-optimized the performance by integrating the advantages of our marketable products ‘XYM’&’MX4R’ and the innovations of our new product ‘RX50M’ with marketing demand. With excellent imaging performance and comfortable operating experience, CX40M provides high cost-effective solution for metallographic analysis and industrial inspection.

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MoPao®200DE/250DE Metallographic grinding/polishing machine

This grinder polisher is single plate. It is suitable for pre grinding, grinding and polishing metallographic specimens.

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MX8R Metallurigical Microscope

MX8R SEMICONDUCTOR FPD INSPECTION MICROSCOPE High efficient solution for semiconductor and FPD inspection.

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Consumables

Scope of application: coarse grinding, fine grinding and super fine grinding of various metallographic samples of black and non-ferrous metals. It can be dry or wet, convenient and flexible, and can quickly achieve the desired smoothness.

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XC1000 Offline Reel Counter

It uses X-Ray perspective principle and independently developed algorithm software with AI function, which can quickly and accurately calculate the number of materials in the material reel.

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SEAMARK X-Ray Inspection Machine X6600

X6600 is a cost-effective general-purpose offline precision microfocus X-Ray inspection equipment. It is suitable for the inspection of various factory offline products.

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ZM-R5860 Hot Air BGA Rework Station

ZM-R5860 Hot Air BGA Rework Station is a kind of rework station provided by ZhuoMao, which has three temperature zone Independently control, convection hot air heating, lower temperature zone height-adjustable, high-precision autonomous control system, high-precision K-type thermocouple with accuracy up to ± 3 ℃, dynamic APR multi-loop closed-loop control selective reflow process. Imported high power […]

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FIB-SEM | DB500

Field Emission Scanning Electron Microscope (FE-SEM) with Focused Ion Beam (FIB) Columns The CIQTEK DB500 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) adopts “SuperTunnel” electron optics technology, low aberration, and non-magnetic objective design with low voltage and high-resolution capability to ensure the nano-scale analysis. The ion column facilitates a Ga+ liquid metal ion source with a highly […]

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SZN71 Zoom Stereo Microscope

Adopting Greenough optical system, SZN71 with compact structure is sleek and sporty. New designed optical path and click stop function, make it more precision and practical for inspection of electronic components and PC board in industrial field, also available for scientific research, education and antiques identification etc.

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