SEAMARK X-Ray Inspection Machine X6600
0.00$0.00
X6600 is a cost-effective general-purpose offline precision microfocus X-Ray inspection equipment. It is suitable for the inspection of various factory offline products. This AXI inspection machine has the characteristics of high magnification, multi-angle inspection, and a large-area inspection platform.
Features and Advantages
1. Meet the needs of the general industrial X-ray machine and have a wide range of applications.
2. A high-resolution design can obtain the best image in a very short time.
3. Infrared automatic navigation and positioning, quickly select the shooting location.
4. CNC detection mode, fast automatic detection for multi-point array.
5. Oblique multi-angle inspection makes it easier to detect sample defects.
6. Software operation developed by Seamark is simple and easy to use, low operating cost.
7. The X-ray tube and FDP can be rotated at the same time (0-60°), making the detection image clearer and more intuitive.
Applications :
1) Inspection of defects in IC encapsulation, e.g., layer separation, cracks, voids/voids and line integrity.
2) Chip size measurement, line curvature measurement, component solder area proportion measurement.
3) Possible defects in PCB manufacturing processes, e.g., misalignment, solder bridge and opening.
4) Inspection and measurement of SMT solder shorts, cold solder, offset components, solder deficiency, vacuum in solder.
5) Inspection of defects in open, short or abnormal connections that may occur in wiring harnesses and automotive connectors.
6) Inspection for internal breakage or voiding in plastic or metal.
7) Checks for uniformity of battery stacking and electrode welding.
8) Inspection of seed, biological material, etc.
X-Ray Tube Source
Type Sealed Micro-Focus X-Ray Tube
Voltage Range 90 kV, 130 kV
Operating Voltage Range 40-90 kV, 130 kV
Operating Current Range 10- 200 μA, 300 μA
Max Output Power 8 W, 39 W
Micro Focus Spot Size 5 – 15 μm
Flat Panel Detector
Type TFT Industrial Dynamic FPD
Pixel Matrix 1536 x 1536
Field of View 130 × 130 mm
Resolution 5.8 Lp/mm
Frame (1×1) 20 fps
A/D Conversion Bit 16 bits
You may also like
Iqiege 50S precision cutter
The machine is composed of fuselage, control panel, protective cover of cutting room, motor, transverse feed mechanism, loading lever mechanism, cooling system, diamond cutting piece and other components.
Read More
View details
Tungsten Filament SEM | SEM3200
High-performance tungsten filament SEM microscope with excellent imaging quality capabilities in both high and low vacuum modes The CIQTEK SEM3200 SEM Microscope has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.
Read More
View details
Ultra-high Resolution FESEM | SEM5000X
Ultra-high resolution Field Emission Scanning Electron Microscopy (FESEM): 0.6 nm@15 kV and 1.0 nm@1 kV The CIQTEK SEM5000X ultra-high resolution FESEM utilizes the upgraded column engineering process, “SuperTunnel” technology, and high-resolution objective lens design to improve low-voltage imaging resolution. The FESEM SEM5000X specimen chamber ports extend to 16, and the specimen exchange load-lock supports up to 8-inch […]
Read More
View details
CX40M Metallurgical Microscope
As an upgraded metallurgical microscope, CX40M re-optimized the performance by integrating the advantages of our marketable products ‘XYM’&’MX4R’ and the innovations of our new product ‘RX50M’ with marketing demand. With excellent imaging performance and comfortable operating experience, CX40M provides high cost-effective solution for metallographic analysis and industrial inspection.
Read More
View details
MoPao®200DE/250DE Metallographic grinding/polishing machine
This grinder polisher is single plate. It is suitable for pre grinding, grinding and polishing metallographic specimens.
Read More
View details
MX8R Metallurigical Microscope
MX8R SEMICONDUCTOR FPD INSPECTION MICROSCOPE High efficient solution for semiconductor and FPD inspection.
Read More
View details
Consumables
Scope of application: coarse grinding, fine grinding and super fine grinding of various metallographic samples of black and non-ferrous metals. It can be dry or wet, convenient and flexible, and can quickly achieve the desired smoothness.
Read More
View details
XC1000 Offline Reel Counter
It uses X-Ray perspective principle and independently developed algorithm software with AI function, which can quickly and accurately calculate the number of materials in the material reel.
Read More
View details
ZM-R5860 Hot Air BGA Rework Station
ZM-R5860 Hot Air BGA Rework Station is a kind of rework station provided by ZhuoMao, which has three temperature zone Independently control, convection hot air heating, lower temperature zone height-adjustable, high-precision autonomous control system, high-precision K-type thermocouple with accuracy up to ± 3 ℃, dynamic APR multi-loop closed-loop control selective reflow process. Imported high power […]
Read More
View details
FIB-SEM | DB500
Field Emission Scanning Electron Microscope (FE-SEM) with Focused Ion Beam (FIB) Columns The CIQTEK DB500 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) adopts “SuperTunnel” electron optics technology, low aberration, and non-magnetic objective design with low voltage and high-resolution capability to ensure the nano-scale analysis. The ion column facilitates a Ga+ liquid metal ion source with a highly […]
Read More
View details
SZN71 Zoom Stereo Microscope
Adopting Greenough optical system, SZN71 with compact structure is sleek and sporty. New designed optical path and click stop function, make it more precision and practical for inspection of electronic components and PC board in industrial field, also available for scientific research, education and antiques identification etc.
Read More
View details
FESEM | SEM4000Pro
Analytical field emission scanning electron microscope (FESEM) equipped with a high-brightness long-life Schottky field emission electron gun With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode as well as a high-performance low-vacuum […]
Read More
View details