Tungsten Filament SEM | SEM3200
0.00$0.00
High-performance tungsten filament SEM microscope with excellent imaging quality capabilities in both high and low vacuum modes
The CIQTEK SEM3200 SEM Microscope has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.
SEM Detectors for SEM3200
The SEM Microscope is used not only to observe surface morphology but also to analyze the composition of micro-regions on the specimen surface.
CIQTEK SEM Microscope SEM3200 has a large specimen chamber with an extensive interface. In addition to supporting conventional Everhart–Thornley detector (ETD), Backscattered-Electron detector (BSE), and Energy-dispersive X-ray spectroscopy (EDS/EDX), various interfaces such as Electron Backscatter Diffraction Pattern (EBSD) and Cathodoluminescence (CL) are also reserved.
SEM Backscattered-Electron Detector (BSE)
Comparison of secondary electron imaging and backscattered electron imaging
In the backscattered electron imaging mode, the charge effect is significantly suppressed and more information on the composition of the specimen surface can be observed.
| SEM Microscope Models | SEM3200A | SEM3200 | ||
| Electro-Optical Systems | Electron Gun | Pre-aligned Medium-sized Hairpin-type Tungsten Filament | ||
| Resolution | High Vaccum | 3 nm @ 30 kV (SE) | ||
| 4 nm @ 30 kV (BSE) | ||||
| 8 nm @ 3 kV (SE) | ||||
| *Low Vaccum | 3 nm @ 30 kV (SE) | |||
| Magnification | 1-300,000x (Film) | |||
| 1-1000,000x | ||||
| Acceleration Voltage | 0.2 kV ~ 30 kV | |||
| Probe Current | ≥1.2μA, Real-time display | |||
| Imaging Systems | SEM Detectors | Everhart-Thornley Detector (ETD) | ||
| *Backscattered electron detector (BSED), *Low vacuum secondary electron detector(SE), *Energy dispersive spectroscopy (EDS/EDX), etc. | ||||
| Image Format | TIFF, JPG, BMP, PNG | |||
| Vacuum System | Vacuum Model | High Vacuum | Better than 5×10-4 Pa | |
| Low Vacuum | 5 ~ 1000 Pa | |||
| Control Mode | Fully Automated Control | |||
| Specimen Chamber | Camera | Optical Navigation | ||
| Monitoring in the Specimen Chamber | ||||
| Specimen Table | Three Axis Automatic | Five Axis Automatic | ||
| Stage Range | X: 120 mm | X: 120 mm | ||
| Y: 115 mm | Y: 115 mm | |||
| Z: 50 mm | Z: 50 mm | |||
| / | R: 360° | |||
| / | T: -10° ~ +90° | |||
| Software | Operating System | Windows | ||
| Navigations | Optical Navigation, Gesture Quick Navigation | |||
| Automatic Functions | Auto Brightness & Contrast, Auto Focus, Automatic Stigmator | |||
| Special Functions |
Intelligence Assisted Image Astigmatism Correction *Large-FOV Image Stitching (Optional) |
|||
| Installation Requirements | Temperature | 20°C (68°F) ~ 25°C (77°F) | ||
| Humidity | ≤ 50 % | |||
| Power Supply |
AC 220 V (±10 %), 50 Hz, 2 kVA AC 110V (±10%), 60Hz |
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