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MX8R Metallurigical Microscope
MX8R SEMICONDUCTOR FPD INSPECTION MICROSCOPE High efficient solution for semiconductor and FPD inspection.
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Consumables
Scope of application: coarse grinding, fine grinding and super fine grinding of various metallographic samples of black and non-ferrous metals. It can be dry or wet, convenient and flexible, and can quickly achieve the desired smoothness.
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FIB-SEM | DB500
Field Emission Scanning Electron Microscope (FE-SEM) with Focused Ion Beam (FIB) Columns The CIQTEK DB500 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) adopts “SuperTunnel” electron optics technology, low aberration, and non-magnetic objective design with low voltage and high-resolution capability to ensure the nano-scale analysis. The ion column facilitates a Ga+ liquid metal ion source with a highly […]
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